Machinable Ceramic 정밀가공
Wafer Test를 위한 Vertical Probe Card 제조용 Machinable Ceramics Guide Plate 가공
200mm
Wafer
Test용
Hole
Drilling
&
Milling
300mm
Wafer
Test용


 

Photoveel II S
Diameter Depth Minimum Pitch Position accuracy
50㎛ 0.2mm 70㎛ x,y±3~5㎛
60㎛ 0.3mm 80㎛ x,y±3~5㎛
80㎛ 0.3mm 100㎛ x,y±3~5㎛
100㎛ 0.8mm 120㎛ x,y±3~5㎛
120㎛ 1.0mm 140㎛ x,y±3~5㎛
200㎛ 1.5mm 220㎛ x,y±3~5㎛
300㎛ 2.0mm 320㎛ x,y±3~5㎛
 
Diameter:80㎛, Pitch:100㎛
 
Diameter:60㎛, Pitch:80㎛
Copyright Development plus Co., Ltd All Right Reserved 경기도 화성시 서신면 전곡산단5길 69
Tel. 031-356-8386 Fax. 031-356-7118 deplus@deplus.co.kr